X-Ray Fluorescence (XRF Testing)

MES utilizes X-Ray Fluorescence (XRF Testing) for the measurement of thickness layers for single and multiple coatings on just about any substrate. XRF can also be used for elemental analysis and chemical analysis in the investigation of metals, glass, ceramics and building materials; however, we typically prefer other in-house methods for quantitative chemical analysis for better resolution.

  • Determine thickness of single and multiple coating layers
  • Elemental analysis
  • Mineral analysis
  • ASTM B568
  • Requires approximately 1 mil thickness or 1 gram of material