X-Ray Diffraction (XRD)

MES offers rapid and reliable X-Ray Diffraction analysis.

X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Typically, XRD is used for the identification of a crystalline phase or mineral. However, it can also provide information on structures, preferred crystal orientation, and other structural parameters, such as average grain size and strain distribution.

X-ray diffraction patterns are produced by a goniometer, which is rotated at specific angles while bombarding the sample material with X-rays. The diffraction pattern peak intensities are determined by the distribution of atoms within the lattice. The x-ray diffraction pattern is specific to the periodic atomic arrangements in a given material, which is compared to the ICDD standard database of x-ray diffraction patterns for phase identification.

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  • Identification of powdered metal and mineral compounds
  • Quantification of primary and minority crystalline phases
  • Quantification of preferred orientation
  • Measurement of residual stress in metals and ceramics
  • Measurement of crystalline size
  • Requires a gram of material (minimum), which must be ground into a powder