electron beam Lab

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MES offers electron beam microscopy for high magnification imaging, surface characterization, failure analysis, and forensic investigation. Our Electron Beam Lab features several modern scanning electron microscopes with 300,000X magnification, energy dispersive x-ray spectroscopy, and quantitative image analysis. Wavelength dispersive X-ray spectroscopy is performed on particles down to the ppm level.

Analysis by SEM provides a unique depth of field advantage over optical microscopes, allowing the user to focus on irregular fracture surfaces. When combined with the decades of experience of our operators, the MES E-Beam lab provides a powerful and effective failure analysis technique.

WE ARE AN ACCREDITED INDEPENDENT TEST LABORATORY.

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MES offers a first class surface analysis lab for high magnification study of your samples. These analytical techniques provide high magnification characterization and chemistry of metals, ceramics, minerals, polymers, and other materials. Identification of thin films, inorganic phases, precipitates, and contaminants are also possible with our E-Beam lab. Elemental dot maps or line scan profiles are produced with either EDS or WDS chemical data collection.

The MES surface analysis department offers high resolution surface examination tools, including:

  • Scanning Electron Microscopes (SEM)

  • Wavelength Dispersive X-ray Spectrometry (WDS)

  • Energy Dispersive X-ray Spectrometry (EDX/EDS)

  • Chemical analysis using Wavelength Dispersive X-Ray Spectrometry (WDS)

  • Real time X-ray

Digital and hard copy micrographs are produced with our high quality image capturing equipment. These can be emailed, saved on a CD-ROM, or placed on our secure web site for client download.

PRIMARY SURFACE ANALYSIS TESTING INSTRUMENTATION INCLUDES THE FOLLOWING:

  • Zeiss HD-15 with WDS; Thermo Dry EDS

  • JEOL 6460LV Scanning Electron Microscope; INCA EDS