Electron Beam Lab

Our Electron Beam Lab features five electron beam units with 300,000X capability, energy dispersive X-ray spectroscopy, and a quantitative image feature analyzer. Thin film and surface characterization by scanning auger spectroscopy is available including sputter etch profiling for elemental composition at various depths. Wave dispersive X-ray spectroscopy is performed down to the ppm level.

Analysis by SEM provides a unique depth of field advantage over optical microscopes, allowing the user to focus on irregular fracture surfaces. When combined with the decades of experience of our operators, the MES E-Beam lab provides a powerful and effective failure analysis technique.

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Corrosion Product Analysis

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Mineral Identification

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Fracture Mode ID

  • JEOL JSM-6490 Low Vacuum Scanning Electron Microscope with Oxford Energy Dispersive X-Ray
  • JEOL 6100 Scanning Electron Microscope with Oxford Energy Dispersive X-Ray
  • JEOL 5800 Scanning Electron Microscope with Oxford Energy Dispersive X-Ray
  • JEOL JXA-8900 Scanning Electron Microscope with Wavelength Dispersive X-Ray
  • JEOL JAMP 10S Auger Spectrograph
  • Physical Electronics Scanning Auger Spectrograph